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Stein Labs
Stein Labs, LLC is your North American Connection for Napson Corporation

Spreading Resistance Profiling
Resistivity profiling of slant polished wafers

Description SRS-2010
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Measures the resistivity cross sectional profile of semiconductor wafers using slant polished samples
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Applications
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Semiconductors and Solar Cell Materials
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Determine Carrier Densities from Resistivity/Carrier Density Tables
Sample sizes:
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Slant pollished wafer samples, contact us for details and preparation tools.
Measuring range
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1~10E+9 Ω[Spread restance]
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Carrier density range:2E+13 ~ 5E+19 cm2 [N-type silicon]
2E+14 ~ 7E+19 cm2 [P-type silicon]
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