
Stein Labs
Stein Labs, LLC is your North American Connection for Napson Corporation

Point Contact Probing
Systems for measuring Sheet Resistance and Resistivity

RT-70V / TS-7D
Tester + Hand-held 4-point probe

RT-70V/ RG-7C
Tester with Motorized Z Axis

RT-70V / RG-5
Tester + Manual Z axis

RT-70V / RG-7S
Tester + Manual X-Y -Z axes
Measurement tester ; RT-70V
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Thickness input with easy JOG dial operation (RT-70V )
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Tester self-test function/Auto change-over measurement range function
Choose from the following stage models for your purpose & applications:
Measurement stage
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(1) RG-7C: Motorized probe up-down stroke.
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(2) RG-5: Manual probe up-down stroke by hand lever.
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(3) RG-7S: Motorized probe up-down stroke for larger Glass or Film samples with manual X-Y universal stage.
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(4) TS-7D: Hand held four point probe measurement instrument. *Stage plate is an option.
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Applications
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Semiconductor materials, Solar-cell materials (Silicon, Polysilicon, SiC etc)
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Silicon on Insulator
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New materials, functional materials (Carbon nanotube, DLC, graphene, Ag nanowire etc)
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Conductive thin film (Metal, ITO etc)
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Diffused sample (or layer)
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Silicon-related thin films (LTPS etc), IGZO
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Silicon-related epitaxial materials, Ion-implantation sample
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Chemical compound semiconductor (GaAs Epi, GaN Epi, InP, Ga etc)
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Others (*Please contact us for details)
Sample sizes: Depend on measurement stage.
Up to <Circle> 300mm(12 inch) or <Square> 730x920mm size.
Measuring range: [R] 1μ~3M Ω・cm, [RS] 5m~10M Ω/sq
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