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Lifetime Measurement

Life-time measurement systems for Silicon bulk and ingots

HF-90R Lifetime non-contact measurement system
HF-100DCA JIS contact Lifetime measurement system for silicon bulks / ingots

HF-90R

Description

  • Silicon bulk, Prismatic shape (JIS code), Ingot condition
    Non-contact photoconduction vibration decay method
    Data processing by digital oscilloscope and PC with software

 

Applications

  • Silicon ingot, Silicon bulk, Prismatic shape (JIS code)

 

Sample sizes:

- 8 inch, ~156x156mm
-Option(Large size stage: Model RG-3000); ~12 inch, ~210x210mm

Measuring range:

100 ~ 5,000μS (in the range of 10 ~ 5,000Ω・cm)

HF-100DCA

Description

​

  • Global standard model for the lifetime test of silicon bulk
    JIS direct current anodizing method
    Data processing with digital oscilloscope and PC with software


​Applications

  • Silicon ingot, Silicon bulk, Prismatic shape (JIS code)


Sample sizes: 

bulk Silicon profiles, ingot, prismatic

Measuring range: 
50μS~ 20mS

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