Stein Labs
Stein Labs, LLC is your North American Connection for Napson Corporation
Non-Contact Resistance Probes
Non-Contact Probe Systems for measuring Sheet Resistance and Resistivity
EC-80P (Portable)
Description
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Auto-measurement is started by probe sensing the sample
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3 measurement modes for wafer resistivity, bulk resistivity and sheet resistance
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Easy set up of measurement conditions with the JOG dial
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5 probe ranges are available
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2 Probes can be connected simultaneously.
Applications
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Semiconductor materials, Solar-cell materials (Silicon, Polysilicon, SiC etc)
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New materials, functional materials (Carbon nanotube, DLC, graphene, Ag nanowire etc)
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Conductive thin film (Metal, ITO etc)
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Silicon-related epitaxial materials, Ion-implantation sample
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Chemical compound semiconductor (GaAs Epi, GaN Epi, InP, Ga etc)
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Others (*Please contact us for details)
Sample size: Any size and shape can be measured(*Larger than 20mmφ and measurement plane must be flat)
Measuring range:
[R] 0.001 ~ 200 Ω・cm
[RS] 0.01 ~ 1,000 Ω/sq* The probe ranges are Low, Middle, High, S-High, Solar-wafer.
EC-80
Description
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Easy operation and compact design
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Auto-measurement starts by inserting the wafer under the probe
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Easy set up to measurement conditions with JOG dial
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5 model types for each measuring range
Applications
-
Semiconductor materials, Solar-cell materials (Silicon, Polysilicon, SiC etc)
-
New materials, functional materials (Carbon nanotube, DLC, graphene, Ag nanowire etc)
-
Conductive thin film (Metal, ITO etc)
-
Silicon-related epitaxial materials, Ion-implantation sample
-
Chemical compound semiconductor (GaAs Epi, GaN Epi, InP, Ga etc)
-
Others (*Please contact us for details)
Sample size: 8 inch, 156x156mm
Measuring range [R] 0.001 ~ 200 Ω・cm
[RS] 0.01 ~ 3,000 Ω/sq
* The model type is selected from either Low, Middle, High and S-High ranges.
PVE-80
Description
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No contact measurement using Pulse-Voltage excitation
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Very low conductivity range to 50 μΩ to 1 mΩ/sq
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Easy operation and data processing with PC Software
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Calculates Sheet resistance[Ohm/Sq], Electric conductivity[S/cm], Electrical conduction[S]
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*Pulse-Voltage excitation method : Pat. No.5386394
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Joint development with Chiba Univ.
​​ Applications
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Novel materials, functional materials (Carbon nanotube, DLC, graphene, Ag nanowire etc)
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Conductive thin film (Metal, ITO etc)
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Others (*Please contact us for details)
Sample sizes~W300 x D210mm
Measuring range: ​ 50μ ~ 1m Ω/sq