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P/N Type Check

Type Checking tools for semiconductors

 PN-8LP Pen sized P/N Type checking pen by light pulse irradiation
Pn-12a P/N Type Checking by Seebeck effect
PN-50a P/N Type checking benchtop unit by light pulse irradiation

PN-8LP

DESCRIPTION

  • Principle: Photovoltaic effect with the 650nm laser diode

  • Power supply : DC1.5V(size AA alkaline battery), 300mA

  • Instantly Readable Display : P(red) or N(green) LED lamps

APPLICATIONS: Semiconductor materials (Silicon)

SAMPLE SIZE: spot size
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MEASUREMENT RANGE: PN Checking for resistivity range in : 0.02~5,000Ω・cm

PN-12 a

DESCRIPTION

  • Seebeck Effect measurement utilizes a hot and cold probe which contact the semiconductor to determine Type

  • PN Type testing for the widest range of resistivities

  • Best for irregular surfaces such as single crystal Silicon bulk, ingot or wafers

Two Configurations: 

  1.  2 probe ver.(Hot probe, Cold probe),

  2.  1 probe ver.(Hot & Cold probe)


APPLICATIONS: Semiconductor materials (Silicon)
(note: not recommended for thin film or multi-oxidized films on wafers, polycrystalline)

SAMPLE SIZE:  more than 2 inch

MEASUREMENT RANGE: PN Checking range in resistivity : 1m ~ 20k Ω・cm

PN-50a

DESCRIPTION

  • Principle: Photovoltaic effect by light pulse irradiation

  • No damage and no stain by Non-contact method

  • Possible to check even oxidized film on wafer surface

  • Instantly discrimination by optical pulse illuminate


​APPLICATIONS: Semiconductor materials,Silicon

SAMPLE SIZE: more than 30x30mm

MEASUREMENT RANGE: PN Checking range in resistivity : 0.1~1,000Ω・cm

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