Stein Labs
Stein Labs, LLC is your North American Connection for Napson Corporation
P/N Type Check
Type Checking tools for semiconductors
PN-8LP
DESCRIPTION
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Principle: Photovoltaic effect with the 650nm laser diode
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Power supply : DC1.5V(size AA alkaline battery), 300mA
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Instantly Readable Display : P(red) or N(green) LED lamps
APPLICATIONS: Semiconductor materials (Silicon)
SAMPLE SIZE: spot size
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MEASUREMENT RANGE: PN Checking for resistivity range in : 0.02~5,000Ω・cm
PN-12 a
DESCRIPTION
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Seebeck Effect measurement utilizes a hot and cold probe which contact the semiconductor to determine Type
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PN Type testing for the widest range of resistivities
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Best for irregular surfaces such as single crystal Silicon bulk, ingot or wafers
Two Configurations:
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2 probe ver.(Hot probe, Cold probe),
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1 probe ver.(Hot & Cold probe)
APPLICATIONS: Semiconductor materials (Silicon)
(note: not recommended for thin film or multi-oxidized films on wafers, polycrystalline)
SAMPLE SIZE: more than 2 inch
MEASUREMENT RANGE: PN Checking range in resistivity : 1m ~ 20k Ω・cm
PN-50a
DESCRIPTION
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Principle: Photovoltaic effect by light pulse irradiation
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No damage and no stain by Non-contact method
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Possible to check even oxidized film on wafer surface
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Instantly discrimination by optical pulse illuminate
​APPLICATIONS: Semiconductor materials,Silicon
SAMPLE SIZE: more than 30x30mm
MEASUREMENT RANGE: PN Checking range in resistivity : 0.1~1,000Ω・cm