Stein Labs
Stein Labs, LLC is your North American Connection for Napson Corporation
Wafer Mapping - 4 Point Contact
Multi-Point Mapping Systems for measuring Sheet Resistance and Resistivity
RT-3000/RG-2000
Description
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User programmable measurement pattern
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Self-test function, wide measuring range
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Thickness, edge, temperature correction for silicon wafer
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Film thickness conversion function from sheet resistance
Applications
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Semiconductor materials, Solar-cell materials
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New materials, structured materials (Carbon nanotube, DLC, graphene, Ag nanowire etc)
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Conductive thin film (Metal, ITO etc)
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Diffused layers layer)
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​
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Silicon-related epitaxial materials, Ion-implantation sample
Sample sizes:
- 8 inch, ~156x156mm
-Option(Large size stage: Model RG-3000); ~12 inch, ~210x210mm
Measuring range
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1. RT-3000/S version:
[R] 100μ~1M Ω・cm
[RS] 1m~10M Ω/sq
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2. RT-3000/H version:
[RS] 10mΩ/sq?1GΩ/sq
CresBox
Description
​
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Small Footprint Version
- ​User programmable measurement pattern
-
Self-test function, wide measuring range
-
Thickness, edge, temperature correction for silicon wafer
-
Film thickness conversion function from sheet resistance
​Applications
-
Semiconductor materials, Solar-cell materials (Silicon, Polysilicon, SiC etc)
-
New materials, functional materials (Carbon nanotube, DLC, graphene, Ag nanowire etc)
-
Conductive thin film (Metal, ITO etc)
-
Diffused sample (or layer)
-
Silicon-related epitaxial materials, Ion-implantation sample
-
Others (*Please contact us for details)
Sample sizes: ~ 8 inch, ~156x156mm
Measuring range:
[R] 1m~300k Ω・cm
[RS] 5m~10M Ω/sq
RG-200PV
​Description
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Customized specifically for Solar wafers
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User programmable measurement pattern
-
Self-test function, wide measuring range
-
Thickness, & temperature correction for silicon wafer
-
Film thickness conversion function from sheet resistance
Applications
-
Mono / polycrystalline silicon cells, epitaxial wafers
-
Conductive thin film (Metal, ITO etc)
-
Diffused sample (or layer)
-
Silicon-related epitaxial materials, Ion-implantation sample
-
Other sizes and options (*Please contact us for details)
Sample sizes: To 160x 160 mm
Thickness: 100 um to 5 mm
Measuring range:
[R] 1m~300k Ω・cm
[RS] 5m~10M Ω/sq