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PN Type Checking for Semiconductor Materials

PN-8LP​ Probe for Non-Contact PN Type Checking
DESCRIPTION
  • Principle: Photovoltaic effect with the 650nm laser diode
  • Power supply : DC1.5V(size AA alkaline battery), 300mA
  • Instantly Readable Display : P(red) or N(green) LED lamps
APPLICATIONS: Semiconductor materials (Silicon)

SAMPLE SIZE: spot size
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MEASUREMENT RANGE: PN Checking for resistivity range in : 0.02~5,000Ω・cm

PN-50a Platform Style Non-Contact PN Type Checking

DESCRIPTION
  • Principle: Photovoltaic effect by light pulse irradiation
  • No damage and no stain by Non-contact method
  • Possible to check even oxidized film on wafer surface
  • Instantly discrimination by optical pulse illuminate

​APPLICATIONS: Semiconductor materials,Silicon

SAMPLE SIZE: more than 30x30mm

MEASUREMENT RANGE: PN Checking range in resistivity : 0.1~1,000Ω・cm

PN-100BI Inline Non-Contact PN Type Checking for Solar Wafers

DESCRIPTION
  • Principle: Photovoltaic effect with the laser diode
  • Suitable for production line and tranceportation system
  • Connect to host PC by LAN to send measurement command and data
​APPLICATIONS: Solar wafer P/N Checking
SAMPLE SIZES:  156 x 156mm or 210x210mm

MEASUREMENT RANGE: PN Checking range in resistivity : 0.1~100Ω・cm

PN-12a Contact type Seebeck Effect P/N Type Checking
DESCRIPTION
  • Seebeck Effect measurement utilizes a hot and cold probe which contact the semiconductor to determine Type
  • PN Type testing for the widest range of resistivities
  • Best for irregular surfaces such as single crystal Silicon bulk, ingot or wafers
Two Configurations: 
  1.  2 probe ver.(Hot probe, Cold probe),
  2.  1 probe ver.(Hot & Cold probe)

APPLICATIONS: Semiconductor materials (Silicon)
(note: not recommended for thin film or multi-oxidized films on wafers, polycrystalline)

SAMPLE SIZE:  more than 2 inch

MEASUREMENT RANGE: PN Checking range in resistivity : 1m ~ 20k Ω・cm