Non-Contact Sheet Resistance/Resistivity Measurement Systems
NC-110 (NC-110PV) Non-contact In-line resistivity measurement
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Description
Sample sizes
2 ~ 8 inch, ~156x156mm (Option; ~12 inch, ~210x210mm)
Measuring range
[R] 1m ~ 200 Ω・cm (NC-110PV : 0.2 ~ 20 Ω・cm for solar wafer)
[RS] 10m ~ 3,000 Ω/sq
* The range is separated from each Low, Middle, High and S-High probe type.
Please refer the measurement range for each probe type as below;
1 Low ： ０.０１～０.５Ω/□ （０.００１～０.０５Ω‐cm）
2 Middle ： ０.５～１０Ω/□ （０.０５～０.５Ω‐cm）
3 High ： １０～１０００Ω/□ （０.５～６０Ω‐cm）
4 S-High ： １０００～３０００Ω/□ （６０～２００Ω‐cm）
For Measurement of Resistivity + Thickness, use: NC-110-T, NC-110PV-T
- Measurement of sheet resistance without contact by 3 types of probes
- Suitable for production line and transport systems and photovoltaics (PV)
- Connects to host PC by LAN for measurement commands and data
- Semiconductor materials, Solar-cell materials (Silicon, Polysilicon, SiC, CIGS, CIS etc)
- New materials, functional materials (Carbon nanotube, DLC, graphene, Ag nanowire etc)
- Conductive thin film (Metal, ITO etc)
- Silicon-related epitaxial materials, Ion-implantation
- Chemical compound semiconductor (GaAs Epi, GaN Epi, InP, Ga etc)
- Others (*Please contact us for details)
Sample sizes
2 ~ 8 inch, ~156x156mm (Option; ~12 inch, ~210x210mm)
Measuring range
[R] 1m ~ 200 Ω・cm (NC-110PV : 0.2 ~ 20 Ω・cm for solar wafer)
[RS] 10m ~ 3,000 Ω/sq
* The range is separated from each Low, Middle, High and S-High probe type.
Please refer the measurement range for each probe type as below;
1 Low ： ０.０１～０.５Ω/□ （０.００１～０.０５Ω‐cm）
2 Middle ： ０.５～１０Ω/□ （０.０５～０.５Ω‐cm）
3 High ： １０～１０００Ω/□ （０.５～６０Ω‐cm）
4 S-High ： １０００～３０００Ω/□ （６０～２００Ω‐cm）
For Measurement of Resistivity + Thickness, use: NC-110-T, NC-110PV-T
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NC-700 Non-contact Inline sheet resistance measurement module for Conductive layers on a substrate
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Description
Applications
Sample sizes: Please contact us in details
Measuring range: 10～1000Ω/sq [Standard range type]
(* Select a range from 1m ~2000 Ω/sq. Please contact us in details)
*Numbers of probe module : Selectable
Related productFor vacuum chamber environment : NC-700V
Added transmittance measurement function : NC-700+TR
- Inline measurement module for moving substrates such as CIGS, CIS, PET film, glass or paper
- Continuous measurement(~24h) in Roll to Roll with OFFSET FREE capability
- Various applications from the research and development to the production line
Applications
- New materials, functional materials (Carbon nanotube, DLC, graphene, Ag nanowire etc)
- Conductive thin film (Metal, ITO etc)
Sample sizes: Please contact us in details
Measuring range: 10～1000Ω/sq [Standard range type]
(* Select a range from 1m ~2000 Ω/sq. Please contact us in details)
*Numbers of probe module : Selectable
Related productFor vacuum chamber environment : NC-700V
Added transmittance measurement function : NC-700+TR
NC-600 Non-contact Inline sheet resistance measurement module for
Glass FPD or Solar
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Description
Applications
Sample sizes: Please contact us in details
Measuring range: 10～1000Ω/sq [Standard range type]
(* Select a range from 1m ~2000 Ω/sq. Please contact us in details)
*Numbers of probe module : Selectable
- Non-stop and non-contact sheet resistance measurement glass runs
- 1 to 10 probes configurable to sheet size
- Glass collision prevention function
- Continuous test data streaming to the host computer
Applications
- Thin Films on Glass or polymeric structural materials
- Conductive thin film (Metal, ITO etc)
Sample sizes: Please contact us in details
Measuring range: 10～1000Ω/sq [Standard range type]
(* Select a range from 1m ~2000 Ω/sq. Please contact us in details)
*Numbers of probe module : Selectable
