Lifetime Measurement Systems

HF-90R Lifetime measurement system for silicon bulks / ingots with non-contact

Description
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• Silicon bulk, Prismatic shape (JIS code), Ingot condition
• Non-contact photoconduction vibration decay method
• Data processing by digital oscilloscope and PC with software

Applications

• Silicon ingot, Silicon bulk, Prismatic shape (JIS code)

Sample sizes
*Please contact us in details

Measuring range
100 ~ 5,000μS (in the range of 10 ~ 5,000Ω・cm)

HF-100DCA Lifetime measurement system for Silicon bulks/ingots-JIS Method

Description

• Global standard model for the lifetime test of silicon bulk
• JIS direct current anodizing method
  Data processing by digital oscilloscope and PC with software

Applications

• Silicon ingot, Silicon bulk, Prismatic shape (JIS code)

Sample sizes: Please contact us in details

Measuring range: 50 μS~ 20mS

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