Life-time Measurement Systems

HF-90R Life-time measurement system for silicon bulks / ingots with non-contact

Description
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• Silicon bulk, Prismatic shape (JIS code), Ingot condition
• Non-contact photoconduction vibration decay method
• Data processing by digital oscilloscope and PC with software

Applications

• Silicon ingot, Silicon bulk, Prismatic shape (JIS code)

Sample sizes
*Please contact us in details

Measuring range
100 ~ 5,000μS (in the range of 10 ~ 5,000Ω・cm)

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HF-300 Non-contact Mono/Polycrystalline Silicon Wafer or Brick Life-time measurement

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Description

• Non-contact, non-damage measurement by μ-PCD
• Suitable for mono-crystalline and polycrystalline silicon sample
• Multipoint measurement & mapping image
• Passivation with exclusive capsule (for wafer, bulk sample)

Applications
Silicon wafer, blick(bulk) [Mono-crystalline, Polycrystalline]

Sample sizes:

• [Wafer] <Square> ~ 210x210mm, <Circle> ~8 inch
• [Brick] Max. 210(W) x 210(H) x 500(D) mm

Measuring range:
0.1 μS ~ 1000μS (*Compatible to resistivity range ; 0.1 ~ 1,000Ω・cm)
<Laser unit>　Type : Semiconductor laser diode,
Wave length : 905nm, Peak power : 60W, Pulse width : 80nS

Related product
​Inline lifetime measurement module : HF-300BI

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HF-100DCA Life-time measurement system for Silicon bulks/ingots-JIS Method

Description

• Global standard model for the lifetime test of silicon bulk
• JIS direct current anodizing method
  Data processing by digital oscilloscope and PC with software

Applications

• Silicon ingot, Silicon bulk, Prismatic shape (JIS code)

Sample sizes: Please contact us in details

Measuring range: 50 μS~ 20mS

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