Inspection & test equipment
semiconductor, solar, thin film applications.  

Stein Labs is pleased to offer solutions for batch, roll to roll automation, bench top equipment for Semiconductors, thin films, epi wafers,nano-tech from

Please select your product of interest below, or see our "Contacts" page for a more detailed request. 

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Contact Resistance Probe measurement

• 4-point (or 2-point) probe head to contact the sample for the measurement.
• Widest measurement range
• Suitable for various materials.

Non Contact Resistance measurement

• Paired eddy-current probe heads for measurement
• No damage to the measurement surface

​Flatness/Thickness measurement

• Wafer flatness(TTV, BOW, WARP) & thickness 
• No damage to the surface 

PN Type Check
Tests for P or N Type using either the Photoelectric or Seebeck Effect

Spreading Resistance
​Spreading Resistance Measurement System using slant polished substrates​
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Lifetime measurement

• Accurately measure carrier life-times 
• Models for wafers, ingots, bulk, prismatic Silicon

4 Point Probe 
​(Head Only)

• Jandel Jeweled probe heads

​NRW Resistivity
​Reference Wafers

• Accurately calibrated wafer standards
• Complies with SEMI, JIS, ASTM Standards