SRS-2010 Spreading Resistance Measurement System using slant polished substrates
Description:
Applications: Semiconductor materials, Solar-cell materials (Silicon, Polysilicon, SiC etc) Sample sizes: Please contact us in details Measuring range: 1~10E+9 Ω[Spread resistance] Carrier density range: 2E+13 ~ 5E+19 cm2 [N-type silicon] 2E+14 ~ 7E+19 cm2 [P-type silicon] |