Non-Contact Probe Sheet Resistance/Resistivity Measurement System
EC-80
Non-contact sheet resistance/resistivity measurement instrumenton-contact sheet resistance /resistivity measurement instrument Description
Sample sizes 8 inch, 156x156mm Measuring range [R] 1m ~ 200 Ω・cm [RS] 10m ~ 3,000 Ω/sq * The range is separated from each Low, Middle, High and S-High probe type. |
Description
Sample size: Any size and shape can be measured(*Larger than 20mmφ and measurement plane must be flat) Measuring range: [R] 1m ~ 200 Ω・cm [RS] 10m ~ 1,000 Ω/sq* The range is separated from each Low, Middle, High, Solar-wafer probe types. |
Description
Sample sizes~W300 x D210mm Measuring range: 50μ ~ 1m Ω/sq |
NC-10 (NC-20)
Non-contact sheet resistance/resistivity measurement instrument with PC Description
Sample sizes 3 ~ 8 inch, ~156x156mm (Option; 2 inch and/or 12 inch, ~210x210mm) Measuring range: R] 1m ~ 200 Ω・cm [RS] 10m ~ 3,000 Ω/sq * The range is separated from each Low, Middle, High and S-High probe type. |
Mapping Non-Contact Sheet Resistance/Resistivity Measurement Systems
Description
Sample sizes~ 50 to 200 mm dia, or156x156mm -Option(Large size stage: ~300 mm, ~210x210mm Probe Measurement ranges: (1) Low: 0.01~0.5Ω/□ (0.001~0.05Ω-cm) (2) Middle : 0.5~10Ω/□ (0.05~0.5Ω-cm) (3) High : 10~1000Ω/□ (0.5~60Ω-cm) (4) S-High : 1000~3000Ω/□ (60~200Ω-cm) |
Description
Applications
Sample sizes: ~ 8 inch, ~156x156mm Measuring range: [RS] 10E9 to 10E15 Ohms/Sq. |
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DUORES Hand held Sheet resistance measurement instrument
Includes Replaceable probe sets (Non-Contact probe & Contact probe)
Includes Replaceable probe sets (Non-Contact probe & Contact probe)
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Description
Easy to measure sheet resistance & carry around
Replaceable hand-held probes for Non-destructive & Contact type
Replaceable hand-held probes for 2 kinds of measurement methods:
•Long-battery run time : 24h (*Battery-operated mode)
•Measurement data display : Max.100 data points
•Measurement data save : Max.50,000 data points
•Measurement data transfer by USB-Mini
•Measurement unit : Ω/□, S/□,n/m
•Data displayed by 4 digit floating decimal point
*Mainbody+Non-destructive probe set, Mainbody+Contact probe set are also available.
Applications
Any sample within the measurement range
can be measured. (Films, Glass, Papers etc)
•Thin-film (ITO, TCO, etc)
•Low-E-Glass
•CNT(Carbon nanotubes), Graphenmaterials
•Metals (nano-wires, grids, meshes, thin films)
Sample sizes
Any size and shape can be measured.
(*Larger than measurement spot size)
<Measurement Spot size>
・Non-destructive probe(Eddy current type) : φ25mm
・Contact probe(4point probe type) : 9mm
Measuring range
・Non-destructive probe(Eddy current type) : 0.5 -200 Ω/sq
・Contact probe(4point probe type) : 0.1 -4000 Ω/sq
Easy to measure sheet resistance & carry around
Replaceable hand-held probes for Non-destructive & Contact type
Replaceable hand-held probes for 2 kinds of measurement methods:
- Non-destructivetype(Eddy current method)
- Contact type(4point probe method)
•Long-battery run time : 24h (*Battery-operated mode)
•Measurement data display : Max.100 data points
•Measurement data save : Max.50,000 data points
•Measurement data transfer by USB-Mini
•Measurement unit : Ω/□, S/□,n/m
•Data displayed by 4 digit floating decimal point
*Mainbody+Non-destructive probe set, Mainbody+Contact probe set are also available.
Applications
Any sample within the measurement range
can be measured. (Films, Glass, Papers etc)
•Thin-film (ITO, TCO, etc)
•Low-E-Glass
•CNT(Carbon nanotubes), Graphenmaterials
•Metals (nano-wires, grids, meshes, thin films)
Sample sizes
Any size and shape can be measured.
(*Larger than measurement spot size)
<Measurement Spot size>
・Non-destructive probe(Eddy current type) : φ25mm
・Contact probe(4point probe type) : 9mm
Measuring range
・Non-destructive probe(Eddy current type) : 0.5 -200 Ω/sq
・Contact probe(4point probe type) : 0.1 -4000 Ω/sq