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Non-Contact Sheet Resistance/Resistivity Measurement Systems
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NC-110 (NC-110PV) Non-contact In-line resistivity measurement

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Description
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  • Measurement of sheet resistance without contact by 3 types of probes
  • Suitable for production line and transport systems and photovoltaics (PV)
  • Connects to host PC by LAN for measurement commands and data
Applications
  • Semiconductor materials, Solar-cell materials (Silicon, Polysilicon, SiC, CIGS, CIS etc)
  • New materials, functional materials (Carbon nanotube, DLC, graphene, Ag nanowire etc)
  • Conductive thin film (Metal, ITO etc)
  • Silicon-related epitaxial materials, Ion-implantation 
  • Chemical compound semiconductor (GaAs Epi, GaN Epi, InP, Ga etc)
  • Others (*Please contact us for details)

Sample sizes
2 ~ 8 inch, ~156x156mm (Option; ~12 inch, ~210x210mm)

Measuring range
[R] 1m ~ 200 Ω・cm (NC-110PV : 0.2 ~ 20 Ω・cm for solar wafer)
[RS] 10m ~ 3,000 Ω/sq


* The range is separated from each Low, Middle, High and S-High probe type.  
Please refer the measurement range for each probe type as below;

1 Low : 0.01~0.5Ω/□ (0.001~0.05Ω‐cm)
2 Middle : 0.5~10Ω/□ (0.05~0.5Ω‐cm)
3 High : 10~1000Ω/□ (0.5~60Ω‐cm)
4 S-High : 1000~3000Ω/□ (60~200Ω‐cm)

For Measurement of Resistivity + Thickness, use: NC-110-T, NC-110PV-T

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NC-700 Non-contact Inline sheet resistance measurement module for Conductive layers on a substrate


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Description
  • Inline measurement module for moving substrates such as CIGS, CIS, PET film, glass or paper
  • Continuous measurement(~24h) in Roll to Roll with OFFSET FREE capability
  • Various applications from the research and development to the production line

Applications
  • New materials, functional materials (Carbon nanotube, DLC, graphene, Ag nanowire etc)
  • Conductive thin film (Metal, ITO etc)

Sample sizes: Please contact us in details

Measuring range: 10~1000Ω/sq [Standard range type]
(* Select a range from 1m ~2000 Ω/sq. Please contact us in details)
*Numbers of probe module : Selectable

Related productFor vacuum chamber environment : NC-700V
Added transmittance measurement function : NC-700+TR
NC-700 PDF
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NC-600 Non-contact Inline sheet resistance measurement module for
Glass FPD or Solar 

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Description
  • Non-stop and non-contact sheet resistance measurement glass runs 
  • 1 to 10 probes configurable to sheet size
  • Glass collision prevention function
  • Continuous test data streaming to the host computer

Applications
  • Thin Films on Glass or polymeric structural materials
  • Conductive thin film (Metal, ITO etc)

Sample sizes: Please contact us in details

Measuring range: 10~1000Ω/sq [Standard range type]
(* Select a range from 1m ~2000 Ω/sq. Please contact us in details)
*Numbers of probe module : Selectable


NC-700 PDF
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